High Pressure Apparatus for in situ X-ray Diffraction and Electrical Resistance Measurement at Low Teomperature
(低温・高圧でのその場X線解析と電気抵抗測定)
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2020-11-20 10:34:38 +0900 Updated at: 2020-11-20 10:34:38 +0900