HOME > その他の文献 > 書誌詳細Analysis of X-ray reflectivity from sputtered carbon thin films (2) Wavelet transform analysisOleksiy, STARYKOV, SAKURAI, Kenji. Photon Factory Activity Report 2003 PartB 21 59-59. 2004.NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2020-11-20 10:40:10 +0900 更新時刻: 2020-11-20 10:40:10 +0900
