SAMURAI - NIMS Researchers Database

HOME > Misc > Detail

Determination of stacking structure of the epitaxy of bismuth thin films on a Si(111)

C.J. Walker, 坂田修身, 柳沼晋, NAGAO, Tadaaki.

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2020-11-20 10:39:52 +0900Updated at: 2020-11-20 10:39:52 +0900

    ▲ Go to the top of this page