HOME > Misc > DetailDetermination of stacking structure of the epitaxy of bismuth thin films on a Si(111)C.J. Walker, 坂田修身, 柳沼晋, NAGAO, Tadaaki. SPring-8 User Experiment Report 13 88-88. 2004.NIMS author(s)NAGAO, TadaakiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2020-11-20 10:39:52 +0900Updated at: 2020-11-20 10:39:52 +0900