HOME > その他の文献 > 書誌詳細Measurement of mesoscopic-range strain field under the SiO2/Si interface by using X-ray forbidden reflectionYASHIRO, Wataru, MIKI, Kazushi, 依田芳卓, 高橋敏男. Spring 8 User Experiment Report No.11 (2003A) 11 73. 2003.NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2020-11-20 10:39:39 +0900 更新時刻: 2020-11-20 10:39:39 +0900
