Measurement of mesoscopic-range strain field under the SiO2/Si interface by using X-ray forbidden reflection | SAMURAI, NIMS Researchers Directory Service

HOME > Misc > Detail

Measurement of mesoscopic-range strain field under the SiO2/Si interface by using X-ray forbidden reflection

YASHIRO, Wataru, MIKI, Kazushi, 依田芳卓, 高橋敏男.

Spring 8 User Experiment Report No.11 (2003A) 11 73. 2003.

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2020-11-20 10:39:39 +0900 Updated at: 2020-11-20 10:39:39 +0900

▲ Go to the top of this page