HOME > その他の文献 > 書誌詳細TEM characterization on the interfaces of the (111) diamond metal insulator semiconductor field effect transistor (MISFET) gate LIU, ZHIQUAN, MITSUISHI, Kazutaka, FURUYA, Kazuo, Hirama Kazuyuki, Umezawa Hitoshi, Satoh Mitsuya, Kawarada Hiroshi, Saito Takeyasu, Okushi Hideyo, Park Kyung-ho. Proceedings of the 16th International Microscopy Congress 1487-1487. 2006.NIMS著者三石 和貴Materials Data Repository (MDR)上の本文・データセット作成時刻: 2022-09-05 11:48:08 +0900更新時刻: 2022-09-05 11:48:08 +0900
