HOME > Misc > DetailMetastable defects in oxide thin films小松学, 荻野剛士, HISHITA, Shunichi, 大吉啓司, OHASHI, Naoki, HANEDA, Hajime, 竹中正. Key Engineering Materials 155-158. 1999.NIMS author(s)OHASHI, NaokiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2022-09-05 10:56:29 +0900 Updated at: 2022-09-05 10:56:29 +0900