HOME > その他の文献 > 書誌詳細High-resolution transmission electron microscopy of cubic Si3N4ZHANG Ming (張明), HE Honglia, XU FangFan, T. Sekine, T. Kobayashi, BANDO, Yoshio, Ming Zhang, Hongliang He, F. F. Xu, Y. Bando. Journal of Applied Physics 88 [5] 3070-3072. 2000.https://doi.org/10.1063/1.1287765 NIMS著者小林 敬道板東 義雄Materials Data Repository (MDR)上の本文・データセット作成時刻: 2020-11-20 10:42:41 +0900 更新時刻: 2026-10-01 04:39:54 +0900
