Raman Spectroscopic Measurement of a Vacuum-Deposited C60 Thin Film

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Raman Spectroscopic Measurement of a Vacuum-Deposited C60 Thin Film

KONNO, Toshio, Lingling Ren, Erlon H Martins Ferreira, Guangzhe Piao, José Manuel Juárez García, Froy Martínez Suárez, Sergio J. Jimenez-Sandoval, WAKAHARA, Takatsugu, MIYAZAWA, Kunichi.

PROCEEDINGS OF THE INTERNATIONAL CONFERENCE NANOMATERIALS: APPLICATIONS AND PROPERTIES 01MAN02-1-01MAN02-5. 2015.

NIMS author(s)

WAKAHARA, Takatsugu

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2022-10-22 02:32:49 +0900Updated at: 2022-10-22 02:32:49 +0900