Fabrication and characterization of single-crystalline CoSn(101¯0) kagome metal thin films for interconnect applications: Structure and anisotropic electrical resistivity | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Fabrication and characterization of single-crystalline CoSn(101¯0) kagome metal thin films for interconnect applications: Structure and anisotropic electrical resistivity

Tomoya Nakatani, Nattamon Suwannaharn, Taisuke T. Sasaki.

Applied Physics Letters 127 [20] 203302. 2025.

https://doi.org/10.1063/5.0298962

Open Access AIP Publishing (Publisher) Materials Data Repository (MDR)

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Materials Data Repository (MDR)上の本文・データセット

MDRavailable Fabrication and characterization of single-crystalline CoSn(10-10) kagome metal thin films for interconnect applications: structure and anisotropic electrical resistivity

作成時刻: 2025-12-12 03:08:53 +0900 更新時刻: 2026-09-23 04:35:17 +0900

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