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Direct observation of electron capture and emission processes by the time domain charge pumping measurement of MoS2 FET

著者Koki Taniguchi, Nan Fang, Kosuke Nagashio.
掲載誌名Applied Physics Letters 113 [13] 133505
ISSN: 00036951, 10773118
ESIでのカテゴリ: PHYSICS
出版社AIP Publishing
発表年2018
言語English
DOIhttps://doi.org/10.1063/1.5048099
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