Direct observation of electron capture and emission processes by the time domain charge pumping measurement of MoS2 FET
| Author(s) | Koki Taniguchi, Nan Fang, Kosuke Nagashio. |
|---|---|
| Journal title | Applied Physics Letters 113 [13] 133505 ISSN: 00036951, 10773118 ESI category: PHYSICS |
| Publisher | AIP Publishing |
| Year of publication | 2018 |
| Language | English |
| DOI | https://doi.org/10.1063/1.5048099 |
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