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Evaluation of junction parameters with control of carrier concentration in Bi2Sr2CaCu2O8+ stacked junctions

K. Inomata, S. Sato, K. Nakajima, S.-J. Kim, T. Hatano, Y. Takano, M. Nagao, T. Yamashita.
Physica C: Superconductivity 412-414 1396-1400. 2004.

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