HOME > Article > DetailEvaluation of junction parameters with control of carrier concentration in Bi2Sr2CaCu2O8+ stacked junctionsK. Inomata, S. Sato, K. Nakajima, S.-J. Kim, T. Hatano, Y. Takano, M. Nagao, T. Yamashita. Physica C: Superconductivity 412-414 1396-1400. 2004.https://doi.org/10.1016/j.physc.2003.12.102 NIMS author(s)TAKANO, YoshihikoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 14:39:27 +0900 Updated at: 2026-11-02 05:21:37 +0900