HOME > 論文 > 書誌詳細Optical characterization of individual semiconductor nanostructures using scanning tunneling microscopeT. Tsuruoka. Journal of Electron Microscopy 53 [2] 169-175. 2004.https://doi.org/10.1093/jmicro/53.2.169 NIMS著者鶴岡 徹Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 14:37:40 +0900更新時刻: 2024-10-08 05:43:48 +0900
