HOME > 論文 > 書誌詳細Optical characterization of individual semiconductor nanostructures using scanning tunneling microscopeT. Tsuruoka. Journal of Electron Microscopy 53 [2] 169-175. 2004.https://doi.org/10.1093/jmicro/53.2.169 NIMS著者鶴岡 徹Materials Data Repository (MDR)上の本文・データセット作成時刻 :2016-05-24 14:37:40 +0900 更新時刻 :2020-11-16 23:10:05 +0900