HOME > 論文 > 書誌詳細Device Physics of Contact Issues for the Overestimation and Underestimation of Carrier Mobility in Field-Effect TransistorsChuan Liu, Gongtan Li, Riccardo Di Pietro, Jie Huang, Yong-Young Noh, Xuying Liu, Takeo Minari. Physical Review Applied 8 [3] 034020. 2017.https://doi.org/10.1103/physrevapplied.8.034020 NIMS著者三成 剛生Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-09-26 21:19:26 +0900 更新時刻: 2026-10-03 05:28:05 +0900
