Device Physics of Contact Issues for the Overestimation and Underestimation of Carrier Mobility in Field-Effect Transistors | SAMURAI, NIMS Researchers Directory Service

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Device Physics of Contact Issues for the Overestimation and Underestimation of Carrier Mobility in Field-Effect Transistors

Chuan Liu, Gongtan Li, Riccardo Di Pietro, Jie Huang, Yong-Young Noh, Xuying Liu, Takeo Minari.

Physical Review Applied 8 [3] 034020. 2017.

https://doi.org/10.1103/physrevapplied.8.034020

NIMS author(s)

MINARI, Takeo

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2017-09-26 21:19:26 +0900 Updated at: 2026-11-04 05:28:42 +0900

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