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Device Physics of Contact Issues for the Overestimation and Underestimation of Carrier Mobility in Field-Effect Transistors

Chuan Liu, Gongtan Li, Riccardo Di Pietro, Jie Huang, Yong-Young Noh, Xuying Liu, Takeo Minari.
Physical Review Applied 8 [3] 034020. 2017.

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    Created at: 2017-09-26 21:19:26 +0900Updated at: 2024-04-01 22:55:52 +0900

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