Direct observation of contact resistivity for monolayer TMD based junctions via PL spectroscopy

Linglong Zhang; Yilin Tang; Han Yan; Tanju Yildirim; Shunshun Yang; Haizeng Song; Xiaowei Zhang; Fuguo Tian; Zhongzhong Luo; Jiajie Pei; Qi Yang; Yixin Xu; Xiaoying Song; Ahmed Raza Khan; Sihao Xia; Xueqian Sun; Bo Wen; Fei Zhou; Weiwei Li; Youwen Liu; Han Zhang; Linglong Zhang; Yilin Tang; Han Yan; Tanju Yildirim; Shunshun Yang; Haizeng Song; Xiaowei Zhang; Fuguo Tian; Zhongzhong Luo; Jiajie Pei; Qi Yang; Yixin Xu; Xiaoying Song; Ahmed Raza Khan; Sihao Xia; Xueqian Sun; Bo Wen; Fei Zhou; Weiwei Li; Youwen Liu; Han Zhang

doi:10.1039/d2nr01504h

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Direct observation of contact resistivity for monolayer TMD based junctions via PL spectroscopy
(Direct observation of contact resistivity for monolayer TMD based junctions via PL spectroscopy)

Linglong Zhang, Yilin Tang, Han Yan, Tanju Yildirim, Shunshun Yang, Haizeng Song, Xiaowei Zhang, Fuguo Tian, Zhongzhong Luo, Jiajie Pei, Qi Yang, Yixin Xu, Xiaoying Song, Ahmed Raza Khan, Sihao Xia, Xueqian Sun, Bo Wen, Fei Zhou, Weiwei Li, Youwen Liu, Han Zhang.

Nanoscale 14 [23] 8260-8270. 2022.

https://doi.org/10.1039/d2nr01504h

NIMS著者

Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2023-01-23 12:21:40 +0900 更新時刻: 2025-06-14 09:03:23 +0900

Direct observation of contact resistivity for monolayer TMD based junctions via PL spectroscopy(Direct observation of contact resistivity for monolayer TMD based junctions via PL spectroscopy)

NIMS著者

Materials Data Repository (MDR)上の本文・データセット

Direct observation of contact resistivity for monolayer TMD based junctions via PL spectroscopy
(Direct observation of contact resistivity for monolayer TMD based junctions via PL spectroscopy)