HOME > Article > DetailElectrode structures in diode-type cadmium telluride detectors Field emission scanning electron microscopy and energy-dispersive x-ray microanalysis(走査電子顕微鏡およびX線マイクロ分析によるダイオード型CdTe検出器の電極構造の解析)Kyoko Okada, Hideyuki Yasufuku, Hideki Yoshikawa, Yoshiharu Sakurai. Applied Physics Letters 92 [7] 073501. 2008.https://doi.org/10.1063/1.2825565 NIMS author(s)YOSHIKAWA, HidekiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 15:27:17 +0900 Updated at: 2026-11-01 05:33:31 +0900