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New Direct Spectroscopic Method for Determination of Bias-Dependent Electronic States: Hard X-ray Photoelectron Spectroscopy Under Device Operation

Yoshiyuki Yamashita, Hideki Yoshikawa, Toyohiro Chikyo, Keisuke Kobayashi.
Japanese Journal of Applied Physics 52 [10R] 108005. 2013.
https://doi.org/10.7567/jjap.52.108005
Open Access IOP Publishing (Publisher)

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      作成時刻: 2016-05-24 17:10:34 +0900更新時刻: 2024-03-31 13:31:29 +0900

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