New Direct Spectroscopic Method for Determination of Bias-Dependent Electronic States: Hard X-ray Photoelectron Spectroscopy Under Device Operation | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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New Direct Spectroscopic Method for Determination of Bias-Dependent Electronic States: Hard X-ray Photoelectron Spectroscopy Under Device Operation

Yoshiyuki Yamashita, Hideki Yoshikawa, Toyohiro Chikyo, Keisuke Kobayashi.

Japanese Journal of Applied Physics 52 [10R] 108005. 2013.

https://doi.org/10.7567/jjap.52.108005

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作成時刻: 2016-05-24 17:10:34 +0900 更新時刻: 2026-09-29 06:55:26 +0900

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