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Effect of Fe impurity on the dislocations in 4H-SiC: Insights from electrical and optical characterization

Bin Chen, Takashi Sekiguchi, Hirofumi Matsuhata, Takasumi Ohyanagi, Akimasa Kinoshita, Hajime Okumura.
Japanese Journal of Applied Physics 53 [5S1] 05FG01. 2014.
https://doi.org/10.7567/jjap.53.05fg01

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