HOME > Article > DetailThickness dependence of spin Peltier effect visualized by thermal imaging techniqueShunsuke Daimon, Ken-ichi Uchida, Naomi Ujiie, Yasuyuki Hattori, Rei Tsuboi, Eiji Saitoh. Applied Physics Express 13 [10] 103001. 2020.https://doi.org/10.35848/1882-0786/abb2b5 NIMS author(s)UCHIDA, KenichiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2020-09-09 03:00:18 +0900 Updated at: 2026-09-29 05:58:33 +0900
