HOME > 論文 > 書誌詳細Two-probe electrical measurements in transmission electron microscopes - Behavioral control of tungsten microwiresPedro M.F.J. Costa, Xiaosheng Fang, Shiliang Wang, Yuehui He, Yoshio Bando, Masanori Mitome, Jin Zou, Han Huang, Dmitri Golberg. Microscopy Research and Technique 72 [2] 93-100. 2009.https://doi.org/10.1002/jemt.20648 NIMS著者板東 義雄三留 正則ゴルバーグ デミトリMaterials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 15:40:13 +0900更新時刻: 2024-04-01 19:56:36 +0900
