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Two-probe electrical measurements in transmission electron microscopes - Behavioral control of tungsten microwires

Pedro M.F.J. Costa, Xiaosheng Fang, Shiliang Wang, Yuehui He, Yoshio Bando, Masanori Mitome, Jin Zou, Han Huang, Dmitri Golberg.
Microscopy Research and Technique 72 [2] 93-100. 2009.
https://doi.org/10.1002/jemt.20648

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