Development and Application of Multiple-Probe Scanning Probe Microscopes

Tomonobu Nakayama; Osamu Kubo; Yoshitaka Shingaya; Seiji Higuchi; Tsuyoshi Hasegawa; Chun-Sheng Jiang; Taichi Okuda; Yuji Kuwahara; Kazuhiro Takami; Masakazu Aono; Tomonobu Nakayama; Osamu Kubo; Yoshitaka Shingaya; Seiji Higuchi; Tsuyoshi Hasegawa; Chun-Sheng Jiang; Taichi Okuda; Yuji Kuwahara; Kazuhiro Takami; Masakazu Aono

doi:10.1002/adma.201200257

Development and Application of Multiple-Probe Scanning Probe Microscopes

Tomonobu Nakayama, Osamu Kubo, Yoshitaka Shingaya, Seiji Higuchi, Tsuyoshi Hasegawa, Chun-Sheng Jiang, Taichi Okuda, Yuji Kuwahara, Kazuhiro Takami, Masakazu Aono.

Advanced Materials 24 [13] 1675-1692. 2012.

https://doi.org/10.1002/adma.201200257

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2016-05-24 16:38:41 +0900Updated at: 2024-03-31 13:15:26 +0900