Effect of native defects on thermoelectric properties of copper iodide films

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Peter P. Murmu, Varun Karthik, Shen V. Chong, Sergey Rubanov, Zihang Liu, Takao Mori, Jiabao Yi, John Kennedy.

Emergent Materials 4 [3] 761-768. 2021.

作成時刻: 2021-06-05 03:00:25 +0900更新時刻: 2024-04-02 03:16:54 +0900