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Effect of native defects on thermoelectric properties of copper iodide films

Peter P. Murmu, Varun Karthik, Shen V. Chong, Sergey Rubanov, Zihang Liu, Takao Mori, Jiabao Yi, John Kennedy.
Emergent Materials 4 [3] 761-768. 2021.

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    Created at: 2021-06-05 03:00:25 +0900Updated at: 2024-04-02 03:16:54 +0900

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