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Effect of native defects on thermoelectric properties of copper iodide films

著者Peter P. Murmu, Varun Karthik, Shen V. Chong, Sergey Rubanov, Zihang Liu, Takao Mori, Jiabao Yi, John Kennedy.
掲載誌名Emergent Materials 4 [3] 761-768
出版社Springer Science and Business Media LLC
発表年2021
言語English
DOIhttps://doi.org/10.1007/s42247-021-00190-w
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