In situ Surface-Enhanced Infrared Absorption Spectroscopy for the Analysis of the Adsorption and Desorption Process of Au Nanoparticles on the SiO2/Si Surface | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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In situ Surface-Enhanced Infrared Absorption Spectroscopy for the Analysis of the Adsorption and Desorption Process of Au Nanoparticles on the SiO2/Si Surface
(SiO2/Si 表面へのAuナノ粒子の赤外吸収分光法による吸着脱離課程のその場解析)

Dominik Enders, Tadaaki Nagao, Tomonobu Nakayama, Masakazu Aono.

Langmuir 23 [11] 6119-6125. 2007.

https://doi.org/10.1021/la063239n

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作成時刻: 2016-05-24 15:21:35 +0900更新時刻: 2024-04-01 19:50:54 +0900

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