HOME > 論文 > 書誌詳細Understanding Thickness-Dependent Charge Transport in Pentacene Transistors by Low-Frequency NoiseYong Xu, Chuan Liu, William Scheideler, Songlin Li, Wenwu Li, Yen-Fu Lin, Francis Balestra, Gerard Ghibaudo, Kazuhito Tsukagoshi. IEEE Electron Device Letters 34 [10] 1298-1300. 2013.https://doi.org/10.1109/led.2013.2277613 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻 :2016-05-24 17:10:27 +0900 更新時刻 :2022-09-05 13:55:35 +0900