SAMURAI - NIMS Researchers Database

HOME > 論文 > 書誌詳細

Understanding Thickness-Dependent Charge Transport in Pentacene Transistors by Low-Frequency Noise

Yong Xu, Chuan Liu, William Scheideler, Songlin Li, Wenwu Li, Yen-Fu Lin, Francis Balestra, Gerard Ghibaudo, Kazuhito Tsukagoshi.
IEEE Electron Device Letters 34 [10] 1298-1300. 2013.

NIMS著者


    Materials Data Repository (MDR)上の本文・データセット


      作成時刻 :2016-05-24 17:10:27 +0900 更新時刻 :2022-09-05 13:55:35 +0900

      ▲ページトップへ移動