Postgrowth annealing of defects in ZnO studied by positron annihilation, X-ray diffraction, Rutherford backscattering, cathodolu
(陽電子、X線、RBS、CL、ホール効果によるZnO中の欠陥の熱回復過程の研究)
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2016-05-24 11:59:07 +0900 Updated at: 2026-10-29 04:16:05 +0900