HOME > 論文 > 書誌詳細Sharing of secondary electrons by in-lens and out-lens detector in low voltage scanning electron microscope equipped with immersion lensKazuhiro Kumagai, Takashi Sekiguchi. Ultramicroscopy 109 [4] 368-372. 2009.https://doi.org/10.1016/j.ultramic.2009.01.005 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 15:44:43 +0900更新時刻: 2024-04-01 19:49:03 +0900
