Impact of Mg concentration on energy-band-depth profile of Mg-doped InN epilayers analyzed by hard X-ray photoelectron spectroscopy

M. Imura; S. Tsuda; T. Nagata; H. Takeda; M. Y. Liao; A. L. Yang; Y. Yamashita; H. Yoshikawa; Y. Koide; K. Kobayashi; T. Yamaguchi; M. Kaneko; N. Uematsu; K. Wang; T. Araki; Y. Nanishi; M. Imura; S. Tsuda; T. Nagata; H. Takeda; M. Y. Liao; A. L. Yang; Y. Yamashita; H. Yoshikawa; Y. Koide; K. Kobayashi; T. Yamaguchi; M. Kaneko; N. Uematsu; K. Wang; T. Araki; Y. Nanishi

doi:10.1063/1.4826094

Impact of Mg concentration on energy-band-depth profile of Mg-doped InN epilayers analyzed by hard X-ray photoelectron spectroscopy

M. Imura, S. Tsuda, T. Nagata, H. Takeda, M. Y. Liao, A. L. Yang, Y. Yamashita, H. Yoshikawa, Y. Koide, K. Kobayashi, T. Yamaguchi, M. Kaneko, N. Uematsu, K. Wang, T. Araki, Y. Nanishi.

Applied Physics Letters 103 [16] 162110. 2013.

https://doi.org/10.1063/1.4826094

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Created at: 2016-05-24 17:11:23 +0900 Updated at: 2026-09-29 06:56:12 +0900