Impact of Mg concentration on energy-band-depth profile of Mg-doped InN epilayers analyzed by hard X-ray photoelectron spectroscopy
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at :2016-05-24 17:11:23 +0900 Updated at :2022-09-05 13:56:41 +0900