Tuning Wall Thicknesses in Mesoporous Silica Films for Optimization of Optical Anti-Reflective Properties

Nawfel Abdullah; Md. Shahriar A Hossain; Konstantin Konstantinov; Hirofumi Tanabe; Mikiya Matsuura; Kazuhiko Maekawa; Amanullah Fatehmulla; Wazirzada Aslam Farooq; Md. Tofazzal Islam; Yoshio Bando; Yusuf Valentino Kaneti; Yusuke Yamauchi; Nawfel Abdullah; Md. Shahriar A Hossain; Konstantin Konstantinov; Hirofumi Tanabe; Mikiya Matsuura; Kazuhiko Maekawa; Amanullah Fatehmulla; Wazirzada Aslam Farooq; Md. Tofazzal Islam; Yoshio Bando; Yusuf Valentino Kaneti; Yusuke Yamauchi

doi:10.1166/jnn.2018.14558

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Tuning Wall Thicknesses in Mesoporous Silica Films for Optimization of Optical Anti-Reflective Properties

Nawfel Abdullah, Md. Shahriar A Hossain, Konstantin Konstantinov, Hirofumi Tanabe, Mikiya Matsuura, Kazuhiko Maekawa, Amanullah Fatehmulla, Wazirzada Aslam Farooq, Md. Tofazzal Islam, Yoshio Bando, Yusuf Valentino Kaneti, Yusuke Yamauchi.

Journal of Nanoscience and Nanotechnology 18 [1] 100-103. 2018.

https://doi.org/10.1166/jnn.2018.14558

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板東義雄

Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2019-05-25 03:00:26 +0900 更新時刻: 2026-05-02 04:30:21 +0900