Tuning Wall Thicknesses in Mesoporous Silica Films for Optimization of Optical Anti-Reflective Properties

Nawfel Abdullah; Md. Shahriar A Hossain; Konstantin Konstantinov; Hirofumi Tanabe; Mikiya Matsuura; Kazuhiko Maekawa; Amanullah Fatehmulla; Wazirzada Aslam Farooq; Md. Tofazzal Islam; Yoshio Bando; Yusuf Valentino Kaneti; Yusuke Yamauchi; Nawfel Abdullah; Md. Shahriar A Hossain; Konstantin Konstantinov; Hirofumi Tanabe; Mikiya Matsuura; Kazuhiko Maekawa; Amanullah Fatehmulla; Wazirzada Aslam Farooq; Md. Tofazzal Islam; Yoshio Bando; Yusuf Valentino Kaneti; Yusuke Yamauchi

doi:10.1166/jnn.2018.14558

Tuning Wall Thicknesses in Mesoporous Silica Films for Optimization of Optical Anti-Reflective Properties

Nawfel Abdullah, Md. Shahriar A Hossain, Konstantin Konstantinov, Hirofumi Tanabe, Mikiya Matsuura, Kazuhiko Maekawa, Amanullah Fatehmulla, Wazirzada Aslam Farooq, Md. Tofazzal Islam, Yoshio Bando, Yusuf Valentino Kaneti, Yusuke Yamauchi.

Journal of Nanoscience and Nanotechnology 18 [1] 100-103. 2018.

https://doi.org/10.1166/jnn.2018.14558

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2019-05-25 03:00:26 +0900Updated at: 2024-04-02 01:11:50 +0900