HOME > 論文 > 書誌詳細Local thickness and composition measurements from scanning convergent-beam electron diffraction of a binary non-crystalline material obtained by a pixelated detectorK. Nakazawa, K. Mitsuishi, K. Shibata, S. Amma, T. Mizoguchi. Ultramicroscopy 217 113077. 2020.https://doi.org/10.1016/j.ultramic.2020.113077 Open Access Elsevier BV (Publisher) NIMS著者三石 和貴Materials Data Repository (MDR)上の本文・データセット作成時刻 :2020-11-25 03:00:15 +0900 更新時刻 :2021-09-30 03:14:21 +0900