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Local thickness and composition measurements from scanning convergent-beam electron diffraction of a binary non-crystalline material obtained by a pixelated detector

K. Nakazawa, K. Mitsuishi, K. Shibata, S. Amma, T. Mizoguchi.
Ultramicroscopy 217 113077. 2020.
Open Access Elsevier BV (Publisher)

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    作成時刻 :2020-11-25 03:00:15 +0900 更新時刻 :2021-09-30 03:14:21 +0900

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