HOME > Article > DetailDetermination of the input parameters for inelastic background analysis combined with HAXPES using a reference sampleC. Zborowski, O. Renault, A. Torres, Y. Yamashita, G. Grenet, S. Tougaard. Applied Surface Science 432 60-70. 2018.https://doi.org/10.1016/j.apsusc.2017.06.081 NIMS author(s)YAMASHITA, YoshiyukiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-12-06 20:34:40 +0900Updated at: 2024-04-01 22:42:25 +0900