HOME > Article > DetailInternational round robin test for tensile testing HTS wires at cryogenic temperaturesN Bagrets, V A Anvar, L Chiesa, M A Delgado, D M McRae, A Nijhuis, G Nishijima, K Osamura, H S Shin, R P Walsh, K-P Weiss, Y Zhang, Y Zhao, Z Zhao. Superconductor Science and Technology 32 [2] 024005. 2019.https://doi.org/10.1088/1361-6668/aaf619 NIMS author(s)NISHIJIMA, GenFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2019-04-17 03:13:04 +0900 Updated at: 2026-09-29 05:46:51 +0900
