HOME > 論文 > 書誌詳細International round robin test for tensile testing HTS wires at cryogenic temperaturesN Bagrets, V A Anvar, L Chiesa, M A Delgado, D M McRae, A Nijhuis, G Nishijima, K Osamura, H S Shin, R P Walsh, K-P Weiss, Y Zhang, Y Zhao, Z Zhao. Superconductor Science and Technology 32 [2] 024005. 2019.https://doi.org/10.1088/1361-6668/aaf619 NIMS著者西島 元Materials Data Repository (MDR)上の本文・データセット作成時刻: 2019-04-17 03:13:04 +0900 更新時刻: 2026-09-29 05:46:51 +0900
