Probing of Polarization Reversal in Ferroelectric (Al,Sc)N Films Using Single‐ and Tri‐Layered Structures With Different Sc/(Al+Sc) Ratio

Shinnosuke Yasuoka; Takao Shimizu; Kazuki Okamoto; Nana Sun; Soshun Doko; Naoko Matsui; Toshikazu Irisawa; Koji Tsunekawa; Alexei Gruverman; Hiroshi Funakubo; Shinnosuke Yasuoka; Takao Shimizu; Kazuki Okamoto; Nana Sun; Soshun Doko; Naoko Matsui; Toshikazu Irisawa; Koji Tsunekawa; Alexei Gruverman; Hiroshi Funakubo

doi:10.1002/admi.202400627

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Probing of Polarization Reversal in Ferroelectric (Al,Sc)N Films Using Single‐ and Tri‐Layered Structures With Different Sc/(Al+Sc) Ratio

Shinnosuke Yasuoka, Takao Shimizu, Kazuki Okamoto, Nana Sun, Soshun Doko, Naoko Matsui, Toshikazu Irisawa, Koji Tsunekawa, Alexei Gruverman, Hiroshi Funakubo.

Advanced Materials Interfaces 12 [5] 2400627. 2025.

https://doi.org/10.1002/admi.202400627

Open Access Wiley (Publisher) Materials Data Repository (MDR)

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清水荘雄

Materials Data Repository (MDR)上の本文・データセット

MDRavailable Probing of Polarization Reversal in Ferroelectric (Al,Sc)N Films Using Single‐ and Tri‐Layered Structures With Different Sc/(Al+Sc) Ratio

作成時刻: 2025-12-18 03:10:27 +0900 更新時刻: 2026-09-28 05:55:49 +0900