HOME > 論文 > 書誌詳細Quantitative theoretical analysis of the electrostatic force between a metallic tip and semiconductor surface in Kelvin probe force microscopyNobuyuki Ishida, Takaaki Mano. Nanotechnology 36 [7] 075701. 2025.https://doi.org/10.1088/1361-6528/ad960e Open Access IOP Publishing (Publisher) Materials Data Repository (MDR) NIMS著者石田 暢之間野 高明Materials Data Repository (MDR)上の本文・データセットMDRavailable Quantitative theoretical analysis of the electrostatic force between a metallic tip and semiconductor surface in Kelvin probe force microscopy 作成時刻: 2024-12-05 03:15:47 +0900 更新時刻: 2026-03-21 04:33:10 +0900