HOME > 論文 > 書誌詳細Quantitative theoretical analysis of the electrostatic force between a metallic tip and semiconductor surface in Kelvin probe force microscopyNobuyuki Ishida, Takaaki Mano. Nanotechnology 36 [7] 075701. 2025.https://doi.org/10.1088/1361-6528/ad960e NIMS著者石田 暢之間野 高明Materials Data Repository (MDR)上の本文・データセット作成時刻: 2024-12-05 03:15:47 +0900更新時刻: 2025-01-07 04:31:40 +0900