HOME > 論文 > 書誌詳細Electronic structure of Ti1−xFexO2−δthin films with oxygen vacancies probed by soft X-ray spectroscopyKatsuya Usui, Shohei Yamaguchi, Naoya Suzuki, Yuichi Shimazu, Takashi Tsuchiya, Enju Sakai, Masaki Kobayashi, Koji Horiba, Hiroshi Kumigashira, Tohru Higuchi. Japanese Journal of Applied Physics 54 [6S1] 06FJ07. 2015.https://doi.org/10.7567/jjap.54.06fj07 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2018-06-13 15:33:39 +0900 更新時刻: 2026-11-02 06:04:04 +0900