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GaAs/AlAs Superlattice as a Proposed New Reference Material for the Sputter Depth Profiling.
(スパッタリングによる深さ方向解析用標準試料としてのGaAs/AlAs超格子.)

吉原一紘, D.W.Moon, K. Yoshihara, D. W. Moon, D. Fujita, K. J. Kim, K. Kajiwara.
Surface and Interface Analysis 20 [13] 1061-1066. 1993.

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