QUID磁束計を用いた極低温磁化測定装置の開発

Yoshiaki Sato; Shun Makiyama; Yasutaka Sakamoto; Tadahiko Hasuo; Yuji Inagaki; Tetsuya Fujiwara; Hiroyuki S. Suzuki; Kazuyuki Matsubayashi; Yoshiya Uwatoko; Tatsuya Kawae

doi:10.7567/jjap.52.106702

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Development of a Low-Temperature Insert for Precise Magnetization Measurement belowT= 2 K with a Superconducting Quantum Interference Device Magnetometer
(QUID磁束計を用いた極低温磁化測定装置の開発)

Yoshiaki Sato, Shun Makiyama, Yasutaka Sakamoto, Tadahiko Hasuo, Yuji Inagaki, Tetsuya Fujiwara, Hiroyuki S. Suzuki, Kazuyuki Matsubayashi, Yoshiya Uwatoko, Tatsuya Kawae.

Japanese Journal of Applied Physics 52 [10R] 106702. 2013.

https://doi.org/10.7567/jjap.52.106702

NIMS著者

Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2016-05-24 17:19:21 +0900更新時刻: 2024-04-02 03:47:03 +0900

Development of a Low-Temperature Insert for Precise Magnetization Measurement belowT= 2 K with a Superconducting Quantum Interference Device Magnetometer(QUID磁束計を用いた極低温磁化測定装置の開発)

NIMS著者

Materials Data Repository (MDR)上の本文・データセット

Development of a Low-Temperature Insert for Precise Magnetization Measurement belowT= 2 K with a Superconducting Quantum Interference Device Magnetometer
(QUID磁束計を用いた極低温磁化測定装置の開発)