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Effect of thickness-dependent structural defects on electrical stability of MoS2 thin film transistors
(NA)

著者Ji-In Park, Yujin Jang, Jong-Seong Bae, Jang-Hee Yoon, Hyun Uk Lee, Yutaka Wakayama, Jong-Pil Kim, Yesul Jeong.
掲載誌名Journal of Alloys and Compounds 814 152134
ISSN: 09258388
ESIでのカテゴリ: MATERIALS SCIENCE
出版社Elsevier BV
発表年2020
言語English
DOIhttps://doi.org/10.1016/j.jallcom.2019.152134
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