HOME > 論文 > 書誌詳細Effect of thickness-dependent structural defects on electrical stability of MoS2 thin film transistors(NA)Ji-In Park, Yujin Jang, Jong-Seong Bae, Jang-Hee Yoon, Hyun Uk Lee, Yutaka Wakayama, Jong-Pil Kim, Yesul Jeong. Journal of Alloys and Compounds 814 152134. 2020.https://doi.org/10.1016/j.jallcom.2019.152134 NIMS著者若山 裕Materials Data Repository (MDR)上の本文・データセット作成時刻: 2019-10-05 03:00:17 +0900 更新時刻: 2026-10-04 04:30:58 +0900
