Effect of thickness-dependent structural defects on electrical stability of MoS2 thin film transistors | SAMURAI, NIMS Researchers Directory Service

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Effect of thickness-dependent structural defects on electrical stability of MoS2 thin film transistors
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Ji-In Park, Yujin Jang, Jong-Seong Bae, Jang-Hee Yoon, Hyun Uk Lee, Yutaka Wakayama, Jong-Pil Kim, Yesul Jeong.

Journal of Alloys and Compounds 814 152134. 2020.

https://doi.org/10.1016/j.jallcom.2019.152134

NIMS author(s)

WAKAYAMA, Yutaka

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2019-10-05 03:00:17 +0900 Updated at: 2026-11-05 04:30:05 +0900

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