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Effect of thickness-dependent structural defects on electrical stability of MoS2 thin film transistors
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Ji-In Park, Yujin Jang, Jong-Seong Bae, Jang-Hee Yoon, Hyun Uk Lee, Yutaka Wakayama, Jong-Pil Kim, Yesul Jeong.
Journal of Alloys and Compounds 814 152134. 2020.
https://doi.org/10.1016/j.jallcom.2019.152134

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    Created at: 2019-10-05 03:00:17 +0900Updated at: 2024-04-02 00:51:05 +0900

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