High-Angle Annular Dark Field Scanning Transmission Electron Microscopy of Antiphase Boundary in Rapidly Solidified B2 Type TiPd compound | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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High-Angle Annular Dark Field Scanning Transmission Electron Microscopy of Antiphase Boundary in Rapidly Solidified B2 Type TiPd compound

T. Hara, E. Okunishi, M. Nishida, M. Matsuda.

Philosophical Magazine Letters 87 [1] 59-64. 2007.

https://doi.org/10.1080/09500830601105667

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作成時刻: 2016-05-24 15:07:05 +0900更新時刻: 2024-04-01 18:04:07 +0900

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