Formation of Si nanocrystallites observed by in situ transmission electron microscopy and their effect on the enhancement of Er photoluminescence in Er-doped SiO2 | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Formation of Si nanocrystallites observed by in situ transmission electron microscopy and their effect on the enhancement of Er photoluminescence in Er-doped SiO2
(ErをドープしたSiO2中でのSiナノ結晶のその場観察とErPL発光増大への効果)

N. Fukata, H. Morihiro, R. Shirakawa, K. Murakami, M. Mitome, Y. Bando.

Journal of Applied Physics 102 [11] 114309. 2007.

https://doi.org/10.1063/1.2817639

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作成時刻: 2016-05-24 15:22:42 +0900更新時刻: 2024-04-01 20:30:43 +0900

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