Determination of Beam Affected area and Degradation of Cathodoluminescence in GaAs Induced by Focused Ion Beam Irradiation
(透過型電子顕微鏡中で集束イオンビームにより微細加工したGaAsのミクロ組織とカソードルミネッセンスの変化)
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2016-05-24 11:35:41 +0900 Updated at: 2018-12-14 22:17:50 +0900