HOME > Article > DetailSpatially-resolved EELS analysis of multilayer using EFTEM and STEM(EFTEMおよびSTEMによる多層膜の位置分解EELS分析)K. Kimoto. Journal of Electron Microscopy 50 [6] 523-528. 2001.https://doi.org/10.1093/jmicro/50.6.523 NIMS author(s)KIMOTO, KojiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 11:48:25 +0900 Updated at: 2026-09-30 04:22:38 +0900